Product Description
by Ernst Meyer (Author), Hans Josef Hug (Author), Roland Bennewitz (Author)
Written by three leading experts in the field, this textbook describes and explains all aspects of scanning probe microscopy, i.e. scanning tunneling microscopy, scanning force microscopy, magnetic force microscopy, and related imaging techniques with atomic-scale resolution. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Novel applications and the latest important results are also presented. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Back Jacket
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
