Save 5% on your next order with code PREMIUM5!
100,000+ Products for Home, Medical, Office & Classroom Needs
Search
0 $0.00 USD
1 1

Introduction to Focused Ion Beam Nanometrology - Hardcover
$194.40 USD
$194.40 USD
Sale Sold out
Shipping calculated at checkout.
In stock (100 units), ready to be shipped

Available Offers

Fast delivery available on most orders

Multiple secure payment options accepted
Secure checkout with
  • American Express
  • Apple Pay
  • Diners Club
  • Discover
  • Google Pay
  • Mastercard
  • PayPal
  • Shop Pay
  • Visa

Flight Range: Up to 1,000 meters (3,280 feet)

Maximum Speed: 45 kilometers per hour (28 miles per hour)

For all orders exceeding a value of 100USD shipping is offered for free.

Returns will be accepted for up to 10 days of Customer’s receipt or tracking number on unworn items. You, as a Customer, are obliged to inform us via email before you return the item.

Otherwise, standard shipping charges apply. Check out our delivery Terms & Conditions for more details.

 View Product Details
Product Product subtotal Quantity Price Product subtotal
Introduction to Focused Ion Beam Nanometrology - Hardcover
Introduction to Focused Ion Beam Nanometrology - Hardcover
Introduction to Focused Ion Beam Nanometrology - Hardcover
$194.40/ea		 $0.00
$194.40/ea $0.00

Product Description

by David C. Cox (Author)

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

Number of Pages: 104
Dimensions: 0.25 x 10 x 7 IN
Publication Date: October 01, 2015
you might like